代表性研究成果
已在国际力学领域和集成电路封装领域权威期刊发表SCI论文60余篇,其中第一作者/通讯作者SCI论文40余篇。部分代表性的期刊论文如下:
(1)固体力学和断裂力学方向:
[1]Kong WC,Dai YW*, Liu YH*, Out-of-plane effect on the sharp V-notch tip fields in power-law creeping solids: A three-dimensional asymptotic analysis,International Journal of Solids and Structures, 2022, 236–237, 111352.
[2]Dai YW, Qin F, Liu YH, Chao YJ. On the second order term asymptotic solution for sharp V-notch tip field in elasto-viscoplastic solids.International Journal of Solids and Structures, 2021, 217–218, 106-122.
[3]Dai YW, Qin F, Liu YH, Berto F, Chen HF. Characterizations of material constraint effect for creep crack in center weldment under biaxial loading.International Journal of Fracture2022, 234, 177–193.
[4]Dai YW, Luca Susmel, Qin F. Sharp V-notches in viscoplastic solids: Strain energy rate density rule and fracture toughness.Fatigue & Fracture of Engineering Materials & Structures, 2021; 44:28–42.
[5]Dai YW, Liu YH, Qin F, Chao YJ, Chen HF. Constraint modified time dependent failure assessment diagram (TDFAD) based on C(t)-A2(t) theory for creep crack.International Journal of Mechanical Sciences, 2020, 165, 105193.
[6]Dai YW, Liu YH, Qin F, Chao YJ, Berto F. Estimation of stress field for sharp V-notch in power-law creeping solids: An asymptotic viewpoint.International Journal of Solids and Structures, 2019, 180-181, 189-204.
[7]Dai YW, Liu YH, Chao YJ. Higher order asymptotic analysis of crack tip fields under mode II creeping conditions.International Journal of Solids and Structures, 2017, 125, 89-107.
[8]Dai YW, Liu DH, Liu YH. Mismatch constraint effect of creep crack with modified boundary layer model.Journal of Applied Mechanics-Transactions of the ASME, 2016, 83(3), 031008.
(2)三维集成电路封装可靠性和功率器件可靠性方向:
[1]Wei JH,Dai YW*, Qin F. Inverse identification of cohesive zone parameters for sintered nano-silver joints based on dynamic convolution neural network.Engineering Fracture Mechanics, 2023, 292, 109651.
[2]Dai YW, Zhao LB, Zan Z, Qin F. Mode I fracture of sintered nano-silver doped with nickel-coated multiwall carbon nanotube.Materials Science in Semiconductor Processing,2024, 174, 108171.
[3]Zhang M, Qin F*, Chen S,Dai YW*, Jin Y, Chen P, An T, Gong YP, Effect of capped Cu layer on protrusion behaviors of through silicon via copper (TSV-Cu) under double annealing conditions: Comparative study,IEEE Transactions on Device and Materials Reliability, 2023, 23(1): 89-98.
[4]Dai YW, S Zhao, F Qin, T An, YP Gong, P Chen. Shear fracture resistance enhancement through micropatterning on copper substrate for sintered nano silver joints,International Journal of Adhesion and Adhesives, 2023, 125, 103422.
[5]Zhang M, Qin F*, Chen S*,Dai YW*, Chen P, An T, Protrusion of through silicon via (TSV) copper with double annealing processes,Journal of Electronic Materials, 2022, 51, 2433–2449.
[6]Dai YW, Zhi Zan, Shuai Zhao, F Qin. Mode II cohesive zone law of porous sintered silver joints with nickel coated multiwall carbon nanotube additive under ENF test,Theoretical and Applied Fracture Mechanics, 2022, 121, 103498.
[7]Qin F, Zhao S,Dai YW*, Hu Y, An T, Gong Y. Mud-cracking effect of sintered silver layer on quantifying heat transfer behavior of SiC devices under power cycling: Voronoi tessellation model,IEEE Transactions on Components, Packaging and Manufacturing Technology, 2022, 12(6), 964-972.
[8]Qin F, Zhao S,Dai YW*, Liu L, An T, Chen P, Gong Y. Indentation tests for sintered silver in die-attach interconnection after thermal cycling.Journal of Electronic Packaging- Transactions of the ASME, 2022, 144(3): 031012.
[9]Zhao S,Dai YW*, Qin F*, Li Y, Liu L, Zan Z, An T, Chen P, Gong Y, Wang Y, On mode II fracture toughness of sintered silver based on end-notch flexure (ENF) test considering various sintering parameters,Materials Science and Engineering A, 2021, 823, 141729.
[10]Qin F, Zhao S,Dai YW*, Yang MK, Xiang M, Yu DQ. Study of warpage evolution and control for six-side molded WLCSP in different packaging processes,IEEE Transactions on Components, Packaging and Manufacturing Technology. 2020, 10(4): 730-738.
[11]Qin F, Hu YK,Dai YW*, An T, Chen P, Gong YP, Yu HP. Crack effect on the equivalent thermal conductivity of porously sintered silver.Journal of Electronic Materials, 2020, 49, 5994–6008.
[12]Qin F, Hu YK,Dai YW*, Chen P, An T. Evaluation of thermal conductivity for sintered silver considering aging effect with microstructure based model.Microelectronics Reliability, 2020, 108:113633.
[13]Dai YW, Zhang M, Qin F, Chen P, An T. Effect of silicon anisotropy on interfacial fracture for three dimensional through-silicon-via (TSV) under thermal loading,Engineering Fracture Mechanics, 2019, 209, 274-300